Home Nitrogen-passivated dielectric/InGaAs interfaces with sub-nm equivalent oxide thickness and low interface trap densities
저자
V Chobpattana†, J Son, JJM Law, R Engel-Herbert, CY Huang, S Stemmer*
저널 정보
출간연도
Applied Physics Letters 102, 022907 (2013)
링크
https://doi.org/10.1063/1.4776656
